IOLTS 2009 - Call for Papers

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Venue -- Additional Information -- Committees

Scope

Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, voltage and temperature variations, aging and wearout and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips. The Symposium is sponsored by the IEEE Computer Society Test Technology Technical Council and organized by TIMA Laboratory, INESC-ID, and University of Piraeus.

The topics of interest include (but are not limited to) the following ones:

Reliability issues in nanometer technologies	Dependability aware power and performance management
Design for reliability	Dependability evaluation
Design for variability	Dependable systems design
On-line testing of analog and mixed signal circuits	Field diagnosis, maintainability and reconfiguration
On-line testing in the continuous operation of large systems	Synthesis of on-line testable circuits
On-line testing in automotive, railway, avionics, industry	Fault-tolerant and fail-safe systems
On-line current, temperature, etc, monitoring	On-line power monitoring and control
On-line and off-line built-in self-test	Radiation effects
Self-checking circuits and coding theory	Secure circuit design
	Fault-based attacks and counter measures

Submissions

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The IOLTS Program Committee invites authors to submit papers in the above or related technical areas. Accepted papers will be included in formal Proceedings to be published by the IEEE. Papers must be submitted electronically following the instructions provided at the symposium web site. Papers should be in the standard IEEE conferences double-column format. If accepted, papers should be allowed six pages in the IEEE Proceedings of the Symposium.

Key Dates

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Submission deadline:February 2, 2009
Notification of acceptance:March 27, 2009
Final copy deadline:April 15, 2009

Venue

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IOLTS 2009 will be held in Sesimbra Hotel & SPA, one of the Finest Resorts of the area (http://www.sesimbrahotelspa.com). The hotel is located in a long beach with warm and calm waters 30km south of Lisbon. Portugal’s capital is famous for its monuments, museums and rich cultural life. Although it boasts a range of must-see sights, its biggest pleasures are its streetlife and setting, admired from a pavement cafe or simply by wandering around the atmospheric old quarters.

Additional Information

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Submission Information		General Information
Dimitris Gizopoulos	Abhijit Chatterjee	Michael Nicolaidis	Marcelino Bicho dos Santos
University of Piraeus Department of Informatics Piraeus, Greece Tel: +30 210 414 2372 dgizop@unipi.gr	Georgia Tech School of ECE Atlanta, Georgia, USA Tel: +1 404.894.1880 chat@ece.gatech.edu	TIMA Laboratory Grenoble, France Tel: +33 (0) 4 76 57 46 96 Michael.Nicolaidis@imag.fr	INESC-ID (IST / UTL) Lisbon, Portugal Tel: +351 213100288 marcelino.santos@ist.utl.pt

Committees

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General Chairs
M. Nicolaidis, TIMA Laboratory
M. Santos, IST/UTL, INESC-ID

Program Chairs
D. Gizopoulos, U. Piraeus
A. Chatterjee, Georgia Tech.

Vice-General Chairs
A. Paschalis, U. Athens
Y. Zorian, Virage Logic Vice-Program ChairsR. Galivanche, Intel
S.-J. Wen, Cisco

Special Sessions
R. Aitken, ARM

Local Arrangements
C. Almeida, IST/UTL, INESC-ID

Publications
M. Psarakis, U. Piraeus
N. Zergainoh, TIMA Laboratory

Publicity
L. Anghel, TIMA Laboratory
Y. Makris, Yale U.

Finance
J. Semião, U. Algarve, INESC-ID

Audio Visual
J. Rocha, ISEL
E. Simeu, TIMA Laboratory

ETTTC Liaison
Z. Peng, Linköping U.

Program Committee
J. Abraham, U. Texas at Austin
D. Alexandrescu, iRoC
D. Appello, ST Microelectronics
M. Baklashov, ARM
L. Batina, K. U. Leuven
R. Baumann, TI
M. Benabdenbi, LIP6
S. Bhabu, Cadence
N. Bidokhti, Cisco
E. Boehl, Robert Bosch GmbH
C. Bolchini, Politec. di Milano
A. Bougerol, EADS
A. Bystrov, U. Newcastle
N. Buard, EADS
Y. Cao, Arizona State U.
S. Chakravarty, LSI Logic
V. Chandra, ARM
J. Collet, LAAS
M. Dabreu, Sandisc
R. Drechsler, U. Bremen
P. Fouillat, IXL-ENSEIRB
G. Georgakos, Infineon
G. Gielen, Katholieke U. Leuven
P. Girard, LIRMM
M. Goessel, U. Postdam
A. Haggag, Freescale
J. Hayes, U. Michigan
T. Heijmen, NXP
S. Hellebrand, U. Paderborn
E. Ibe, Hitachi
A. Ivanov, U. Brit. Columbia
R. Iyer, U. Illinois
A. Krasniewski, Warsaw U. T.
S. Kundu, U. Mass. Amherst
R. Leveugle, TIMA
A. Majumdar, AMD/ATI
C. Metra, U. Bologna
S. Mitra, Stanford U.
F. Monteiro, U. Metz
S. Mukherjee, Intel
S. Mukhopadhyaya, Georgia Tech.
D. Nikolos, U. Patras
P. Pande, Washington State U.
C. Papachristou, CWRU
A. Papanikolaou, NTUA
R. Parekhji, TI
I. Parulkar, Sun
B. Paul, Toshiba
S. Piestrak, U. Metz
M. Pignol, CNES
I. Polian, U. Freiburg
D. Pradhan, U. Bristol
P. Prinetto, Politec. di Torino
H. Puchner, Cypress
D. Radaelli, Cypress
M. Rebaudengo, Politec. di Torino
K. Roy, Purdue U.
P. Sanda, IBM
J. Segura, U. Illes Balears
N. Seifert, Intel
C. Slayman, Sun
M. Sonza Reorda, Politec. di Torino
J. Sosnowski, Warsaw U. T.
L. Sourgen, ST Microelectronics
H. Stratigopoulos, TIMA
M. Tehranipoor, U. Connecticut
J. P. Teixeira, IST/INESC-ID
Y. Tosaka, Fujitsu Labs
N. Touba, U. Texas
S. Tragoudas, U. Southern Illinois
T. Uemura, Fujitsu Labs
F. Vargas, PUCRS
R. Velazco, TIMA
X. Vera, Intel Labs Barcelona
M. Violante, Politec. di Torino
I. Voyiatzis, TEI Athens
L.-C. Wang, UC Santa Barbara
A. Wood, Sun
H. J. Wunderlich, U. Stuttgart
Q. Xu, Chinese U. Hong Kong
M. Zhang, Intel

For more information, visit us on the web at: http://www-tima.imag.fr/conferences/iolts

The 15th IEEE International On-Line Testing Symposium (IOLTS2009) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).